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Keywords
Evaluation of EUV scatterometry for CD characterization of EUV masks using rigorous FEM-simulation
(2008)
Dynamics of a Bose-Einstein condensate at finite temperature in an atom-optical coherence filter
(2002)
Efficient optimization of hollow-core photonic crystal fiber design using the finite-element method
(2006)
Large-Area High-Quality Plasmonic Oligomers Fabricated by Angle-Controlled Colloidal Nanolithography
(2011)
A rigorous finite-element domain decomposition method for electromagnetic near field simulations
(2008)
Domain decomposition method for electromagnetic scattering problems: application to EUV lithography
(2005)
Advanced finite-element methods for design and analysis of nano-optical structures: Applications
(2013)
Finite-element based electromagnetic field simulations: Benchmark results for isolated structures
(2013)
Tapered N-helical metamaterials with three-fold rotational symmetry as improved circular polarizers
(2014)
Boosting the photon-extraction efficiency of nanophotonic structures by deterministic microlenses
(2014)
Benchmarking five computational methods for analyzing large photonic crystal membrane cavities
(2017)
The interaction of light and chiral matter is subject of recent research both in fundamental science and applications.
Among these are the helicity of electromagnetic fields described with the optical chirality density and emitters sensitive to
circular polarization employed in quantum communications.
In the weak coupling regime of chiral emitters, we analyze the conversion of chirality which can be regarded as an analogue
to absorption of energy describing the change of circular polarization of the incident field. This enables the tailoring of
chiral near-fields close to metamaterials, e.g. composed of gold helices, and gives insights into extinction measurements
such as circular dichroism.
We show relation of the weak and strong coupling regime. The latter can be modelled with cross electric-magnetic polarizabilities or
with effective chiral materials, i.e. bi-anisotropic media. Accordingly, we motivate the necessity for rigorous numerical
simulations to accurately describe chiral light-matter interaction.
The helicity of light is of great interest
in both fundamental research and in applications such as dichroism spectroscopy. Its
time-harmonic formulation is directly proportional to the density of optical chirality.
Recently, both an helicity optical theorem
(HOT) and a chirality conservation law
(CCL) have been formulated for arbitrary
scatterers taking into account an underlying
continuity equation of this quantity. We
summarize these two equivalent fundamental laws and analyze their potential applications.
The introduction of the near-field quantity of optical chirality has emerged in various numerical and few experimental studies of local chirality enhancement due to its relation to the excitation rate of chiral molecules. This time-even pseudoscalar has been dismissed as being a higher-order version of helicity. Nevertheless, we revisit the derivation of the underlying conservation law and define optical chirality in media similar to. We identify the mechanism of chirality conversion by either inhomogeneous or anisotropic space to complement the conservation of optical chirality.
The conservation law of optical chirality in arbitrary space enables the extension of the concept of polarization to the near-field where no distiniguished propagation direction of light is present. We show that the connection of electromagnetic energy and optical chirality provide the ability to define a circular polarization basis in time-harmonic near-field analysis.
In order to illustrate our theory, we present electromagnetic field simulations of simple as well as more complex nanostructures. Results using the well-known far-field polarization concept are readily reproduced and extended from the point of view of chirality conversion.
Reconstruction of photonic crystal geometries using a reduced basis method for nonlinear outputs
(2016)
Maxwell solvers based on the hp-adaptive finite element method allow for accurate geometrical modeling and high numerical accuracy. These features are indispensable for the optimization of optical properties or reconstruction of parameters through inverse processes. High computational complexity prohibits the evaluation of the solution for many parameters. We present a reduced basis method (RBM) for the time-harmonic electromagnetic scattering problem allowing to compute solutions for a parameter configuration orders of magnitude faster. The RBM allows to evaluate linear and nonlinear outputs of interest like Fourier transform or the enhancement of the electromagnetic field in milliseconds. We apply the RBM to compute light-scattering off two dimensional photonic crystal structures made of silicon and reconstruct geometrical parameters.
Model order reduction for the time-harmonic Maxwell equation applied to complex nanostructures
(2016)
Fields such as optical metrology and computational lithography require fast and efficient methods for solving the time-harmonic Maxwell's equation. Highly accurate geometrical modelling and numerical accuracy at low computational costs are a prerequisite for any simulation study of complex nano-structured photonic devices. We present a reduced basis method (RBM) for the time-harmonic electromagnetic scattering problem based on the hp-adaptive finite element solver JCMsuite capable of handling geometric and non-geometric parameter dependencies allowing for online evaluations in milliseconds. We apply the RBM to compute light-scattering at optical wavelengths of periodic arrays of fin field-effect transistors (FinFETs) where geometrical properties such as the width and height of the fin and gate can vary in a large range.
Optical 3D simulations in many-query and real-time contexts require new solution strategies. We study an adaptive, error controlled reduced
basis method for solving parametrized time-harmonic optical scattering problems. Application fields are, among others, design and optimization problems
of nano-optical devices as well as inverse problems for parameter reconstructions occurring e. g. in optical metrology. The reduced basis method pre-
sented here relies on a finite element modeling of the scattering problem with
parametrization of materials, geometries and sources.