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Reduced basis method for the optimization of nano-photonic devices

Please always quote using this URN: urn:nbn:de:0297-zib-57556
  • Optical 3D simulations in many-query and real-time contexts require new solution strategies. We study an adaptive, error controlled reduced basis method for solving parametrized time-harmonic optical scattering problems. Application fields are, among others, design and optimization problems of nano-optical devices as well as inverse problems for parameter reconstructions occuring e. g. in optical metrology. The reduced basis method presented here relies on a finite element modeling of the scattering problem with parametrization of materials, geometries and sources.

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Author:Martin Hammerschmidt, Sven Herrmann, Sven BurgerORCiD, Jan Pomplun, Frank Schmidt
Document Type:ZIB-Report
Tag:electromagnetic field solver; model reduction; optical critical dimension metrology; reduced basis method
MSC-Classification:65-XX NUMERICAL ANALYSIS
78-XX OPTICS, ELECTROMAGNETIC THEORY (For quantum optics, see 81V80)
CCS-Classification:J. Computer Applications
PACS-Classification:40.00.00 ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS
Date of first Publication:2016/02/25
Series (Serial Number):ZIB-Report (16-10)
ISSN:1438-0064
DOI:https://doi.org/10.1007/s11082-016-0530-1
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