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Correlative Tomography – Extraction of Reliable Information with Adequate Resolution from mm Scale Down to Sub-nm Scale
Author: | Frank Mücklich, Johannes Webel, Hisham Aboulfadl, Norbert LindowORCiD, Hans-Christian HegeORCiDGND |
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Document Type: | Article |
Parent Title (English): | Microsc. Microanal. |
Volume: | 20 |
Issue: | Suppl 3 |
First Page: | 838 |
Last Page: | 839 |
Date of first Publication: | 2014/08/27 |
DOI: | https://doi.org/10.1017/S1431927614005911 |