Correlative Tomography – Extraction of Reliable Information with Adequate Resolution from mm Scale Down to Sub-nm Scale
| Author: | Frank Mücklich, Johannes Webel, Hisham Aboulfadl, Norbert LindowORCiD, Hans-Christian HegeORCiDGND |
|---|---|
| Document Type: | Article |
| Parent Title (English): | Microsc. Microanal. |
| Volume: | 20 |
| Issue: | Suppl 3 |
| First Page: | 838 |
| Last Page: | 839 |
| Date of first Publication: | 2014/08/27 |
| DOI: | https://doi.org/10.1017/S1431927614005911 |

