TY - CHAP A1 - Becker, Christiane A1 - Xavier, Jolly A1 - Preidel, Veit A1 - Wyss, Philippe A1 - Sontheimer, Tobias A1 - Rech, Bernd A1 - Probst, Jürgen A1 - Hülsen, Christoph A1 - Löchel, Bernd A1 - Erko, Alexei A1 - Burger, Sven A1 - Schmidt, Frank A1 - Back, Franziska A1 - Rudigier-Voigt, Eveline T1 - Nanophotonic light trapping in polycrystalline silicon thin-film solar cells using periodically nanoimprint-structured glass substrates T2 - Proc. SPIE Y1 - 2013 U6 - https://doi.org/10.1117/12.2023871 VL - 8824 SP - 88240D ER - TY - JOUR A1 - Becker, Christiane A1 - Wyss, Philippe A1 - Eisenhauer, David A1 - Probst, Jürgen A1 - Preidel, Veit A1 - Hammerschmidt, Martin A1 - Burger, Sven T1 - 5 x 5 cm2 silicon photonic crystal slabs on glass and plastic foil exhibiting broadband absorption and high-intensity near-fields JF - Sci. Rep. Y1 - 2014 U6 - https://doi.org/10.1038/srep05886 VL - 4 SP - 5886 ER - TY - JOUR A1 - Soltwisch, Victor A1 - Haase, Anton A1 - Wernecke, Jan A1 - Probst, Jürgen A1 - Schoengen, Max A1 - Burger, Sven A1 - Krumrey, Michael A1 - Scholze, Frank T1 - Correlated diffuse x-ray scattering from periodically nanostructured surfaces JF - Phys. Rev. B Y1 - 2016 U6 - https://doi.org/10.1103/PhysRevB.94.035419 VL - 94 SP - 035419 ER - TY - JOUR A1 - Barth, Carlo A1 - Probst, Jürgen A1 - Herrmann, Sven A1 - Hammerschmidt, Martin A1 - Becker, Christiane T1 - Numerical characterization of symmetry properties for photonic crystals with hexagonal lattice JF - Proc. SPIE N2 - We present a numerical method to characterize the symmetry properties of photonic crystal (PhC) modes based on field distributions, which themselves can be obtained numerically. These properties can be used to forecast specific features of the optical response of such systems, e.g. which modes are allowed to couple to external radiation fields. We use 2D PhCs with a hexagonal lattice of holes in dielectric as an example and apply our technique to reproduce results from analytical considerations. Further, the method is extended to fully vectorial problems in view of 3D PhCs and PhC slabs, its functionality is demonstrated using test cases and, finally, we provide an efficient implementation. The technique can thus readily be applied to output data of all band structure computation methods or even be embedded – gaining additional information about the mode symmetry. Y1 - 2016 U6 - https://doi.org/10.1117/12.2227094 VL - 9885 SP - 988506 ER - TY - CHAP A1 - Agcos, Emil A1 - Bodermann, Bernd A1 - Burger, Sven A1 - Dai, Gaoliang A1 - Endres, Johannes A1 - Hansen, Poul-Erik A1 - Nielson, Lars A1 - Madsen, Morten A1 - Heidenreich, Sebastian A1 - Krumrey, Michael A1 - Loechel, Bernd A1 - Probst, Jürgen A1 - Scholze, Frank A1 - Soltwisch, Victor A1 - Wurm, Matthias T1 - Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing T2 - Proc. SPIE Y1 - 2015 U6 - https://doi.org/10.1117/12.2190409 VL - 9556 SP - 955610 ER - TY - CHAP A1 - Soltwisch, Victor A1 - Wernecke, Jan A1 - Haase, Anton A1 - Probst, Jürgen A1 - Schoengen, Max A1 - Scholze, Frank A1 - Pomplun, Jan A1 - Burger, Sven T1 - Determination of line profile on nanostructured surfaces using EUV and x-ray scattering T2 - Proc. SPIE Y1 - 2014 U6 - https://doi.org/10.1117/12.2066165 VL - 9235 SP - 92351D ER -