TY - CHAP A1 - Kleemann, B. A1 - Kurz, J. A1 - Hetzler, J. A1 - Pomplun, Jan A1 - Burger, Sven A1 - Zschiedrich, Lin A1 - Schmidt, Frank T1 - Fast online inverse scattering with Reduced Basis Method (RBM) for a 3D phase grating with specific line roughness T2 - Modelling Aspects in Optical Metrology III Y1 - 2011 U6 - https://doi.org/10.1117/12.889364 VL - 8083 SP - 808309 PB - Proc. SPIE ER - TY - CHAP A1 - Neve-Oz, Y. A1 - Pollok, T. A1 - Burger, Sven A1 - Golosovsky, M. A1 - Davidov, D. ED - Mastorakis, N. T1 - Localized resonant states and transmission in a two- dimensional photonic quasicrystal T2 - Proc. of the 5th International Conference on Applied Mathematics, Simulation, Modelling (ASM ’II), Corfu, 2011 Y1 - 2011 SN - 978-1-61804-016-9 VL - 1 SP - 178 EP - 182 ER - TY - JOUR A1 - Schlosser, Felix A1 - Schoth, Mario A1 - Burger, Sven A1 - Schmidt, Frank A1 - Knorr, Andreas A1 - Mukamel, S. A1 - Richter, Marten T1 - Ultrafast nonlinear spectroscopy with spatially confined fields JF - AIP Conference Proceedings Y1 - 2011 U6 - https://doi.org/10.1063/1.3644223 VL - 1398 SP - 94 EP - 96 PB - AIP ER - TY - CHAP A1 - Schmidt, Frank A1 - Pomplun, Jan A1 - Zschiedrich, Lin A1 - Burger, Sven T1 - Fast online simulation of 3D nanophotonic structures by the reduced basis method T2 - Integrated Optics: Devices, Materials, and Technologies XV Y1 - 2011 U6 - https://doi.org/10.1117/12.874726 VL - 7941 SP - 79410G PB - Proc. SPIE ER - TY - CHAP A1 - Pomplun, Jan A1 - Burger, Sven A1 - Zschiedrich, Lin A1 - Schmidt, Frank T1 - Reduced basis method for real-time inverse scatterometry T2 - Modelling Aspects in Optical Metrology III Y1 - 2011 U6 - https://doi.org/10.1117/12.889892 VL - 8083 SP - 808308 PB - Proc. SPIE ER - TY - JOUR A1 - Zhao, J. A1 - Frank, B. A1 - Burger, Sven A1 - Giessen, H. T1 - Large-Area High-Quality Plasmonic Oligomers Fabricated by Angle-Controlled Colloidal Nanolithography JF - ACS Nano Y1 - 2011 U6 - https://doi.org/10.1021/nn203177s VL - 5 IS - 11 SP - 9009 ER - TY - CHAP A1 - Wong, G. A1 - Kang, M. A1 - Lee, H. A1 - Burger, Sven A1 - Zschiedrich, Lin A1 - Biancalana, F. A1 - Russell, P. T1 - Strongly Twisted Solid-Core PCF: A One-Dimensional Chiral Metamaterial T2 - Frontiers in Optics Y1 - 2011 U6 - https://doi.org/10.1364/FIO.2011.FMG3 SP - FMG3 PB - Optical Society of America ER - TY - CHAP A1 - Wenzel, Hans A1 - Crump, Paul A1 - Ekhteraei, Hossein A1 - Schultz, Christoph M. A1 - Pomplun, Jan A1 - Burger, Sven A1 - Zschiedrich, Lin A1 - Schmidt, Frank A1 - Erbert, Götz T1 - Theoretical and experimental analysis of the lateral modes of high-power broad-area lasers T2 - Numerical Simulation of Optoelectronic Devices Y1 - 2011 U6 - https://doi.org/10.1109/NUSOD.2011.6041183 SP - 143 EP - 144 ER - TY - JOUR A1 - Bodermann, Bernd A1 - Buhr, Egbert A1 - Danzebrink, Hans-Ulrich A1 - Bär, Markus A1 - Scholze, Frank A1 - Krumrey, Michael A1 - Wurm, Matthias A1 - Klapetek, Petr A1 - Hansen, Poul-Erik A1 - Korpelainen, Virpi A1 - van Veghel, Marijn A1 - Yacoot, Andrew A1 - Siitonen, Samuli A1 - El Gawhary, Omar A1 - Burger, Sven A1 - Saastamoinen, Toni T1 - Joint Research on Scatterometry and AFM Wafer Metrology JF - AIP Conference Proceedings Y1 - 2011 U6 - https://doi.org/10.1063/1.3657910 VL - 1395 IS - 1 SP - 319 EP - 323 PB - AIP ER - TY - CHAP A1 - Burger, Sven A1 - Zschiedrich, Lin A1 - Pomplun, Jan A1 - Schmidt, Frank ED - Bodermann, Bernd T1 - Rigorous simulations of 3D patterns on extreme ultraviolet lithography masks T2 - Modelling Aspects in Optical Metrology III Y1 - 2011 U6 - https://doi.org/10.1117/12.889831 VL - 8083 SP - 80831B PB - Proc. SPIE ER -