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  <doc>
    <id>5755</id>
    <completedYear/>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>reportzib</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>2016-02-25</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Reduced basis method for the optimization of nano-photonic devices</title>
    <abstract language="eng">Optical 3D simulations in many-query and real-time contexts require new solution strategies. We study an adaptive, error controlled  reduced basis method for solving parametrized time-harmonic optical scattering problems. Application fields are, among others, design and optimization problems of nano-optical devices as well as inverse problems for parameter reconstructions occuring  e. g. in optical  metrology. The reduced basis method presented here relies on a finite element modeling of the scattering problem with parametrization of materials, geometries and sources.</abstract>
    <identifier type="issn">1438-0064</identifier>
    <identifier type="urn">urn:nbn:de:0297-zib-57556</identifier>
    <identifier type="doi">10.1007/s11082-016-0530-1</identifier>
    <author>Martin Hammerschmidt</author>
    <submitter>Martin Hammerschmidt</submitter>
    <author>Sven Herrmann</author>
    <author>Sven Burger</author>
    <author>Jan Pomplun</author>
    <author>Frank Schmidt</author>
    <series>
      <title>ZIB-Report</title>
      <number>16-10</number>
    </series>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>reduced basis method</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>model reduction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>optical critical dimension metrology</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>electromagnetic field solver</value>
    </subject>
    <collection role="ccs" number="J.">Computer Applications</collection>
    <collection role="pacs" number="40.00.00">ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS</collection>
    <collection role="msc" number="65-XX">NUMERICAL ANALYSIS</collection>
    <collection role="msc" number="78-XX">OPTICS, ELECTROMAGNETIC THEORY (For quantum optics, see 81V80)</collection>
    <collection role="institutes" number="num">Numerical Mathematics</collection>
    <collection role="institutes" number="compnano">Computational Nano Optics</collection>
    <collection role="persons" number="burger">Burger, Sven</collection>
    <collection role="persons" number="hammerschmidt">Hammerschmidt, Martin</collection>
    <collection role="projects" number="ECMath-OT4">ECMath-OT4</collection>
    <collection role="projects" number="ECMath-SE6">ECMath-SE6</collection>
    <file>https://opus4.kobv.de/opus4-zib/files/5755/ZIB_Report_16_10.pdf</file>
  </doc>
</export-example>
