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  <doc>
    <id>7186</id>
    <completedYear/>
    <publishedYear>2018</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>157</pageFirst>
    <pageLast>170</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>195</volume>
    <type>article</type>
    <publisherName/>
    <publisherPlace/>
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    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
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    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Three-dimensional reconstruction and quantification of dislocation substructures from transmission electron microscopy stereo pairs</title>
    <abstract language="eng">A great amount of material properties is strongly influenced by dislocations, the carriers of plastic deformation. It is therefore paramount to have appropriate tools to quantify dislocation substructures with regard to their features, e.g., dislocation density, Burgers vectors or line direction. While the transmission electron microscope (TEM) has been the most widely-used equipment implemented to investigate dislocations, it usually is limited to the two-dimensional (2D) observation of three-dimensional (3D) structures. We reconstruct, visualize and quantify 3D dislocation substructure models from only two TEM images (stereo pairs) and assess the results. The reconstruction is based on the manual interactive tracing of filiform objects on both images of the stereo pair. The reconstruction and quantification method are demonstrated on dark field (DF) scanning (S)TEM micrographs of dislocation substructures imaged under diffraction contrast conditions. For this purpose, thick regions (&gt;300 nm) of TEM foils are analyzed, which are extracted from a Ni-base superalloy single crystal after high temperature creep deformation. It is shown how the method allows 3D quantification from stereo pairs in a wide range of tilt conditions, achieving line length and orientation uncertainties of 3% and 7°, respectively. Parameters that affect the quality of such reconstructions are discussed.</abstract>
    <parentTitle language="eng">Ultramicroscopy</parentTitle>
    <identifier type="doi">10.1016/j.ultramic.2018.08.015</identifier>
    <enrichment key="PeerReviewed">yes</enrichment>
    <enrichment key="PreprintUrn">urn:nbn:de:0297-zib-70339</enrichment>
    <author>Leonardo Agudo Jácome</author>
    <submitter>Hans-Christian Hege</submitter>
    <author>Hans-Christian Hege</author>
    <author>Olaf Paetsch</author>
    <author>Kai Pöthkow</author>
    <collection role="institutes" number="vis">Visual Data Analysis</collection>
    <collection role="institutes" number="visalgo">Visual Data Analysis in Science and Engineering</collection>
    <collection role="persons" number="hege">Hege, Hans-Christian</collection>
    <collection role="persons" number="paetsch">Paetsch, Olaf</collection>
    <collection role="projects" number="STEREO">STEREO</collection>
    <collection role="institutes" number="VDcC">Visual and Data-centric Computing</collection>
  </doc>
  <doc>
    <id>7033</id>
    <completedYear/>
    <publishedYear/>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>reportzib</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>2018-08-31</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Three-Dimensional Reconstruction and Quantification of Dislocation Substructures from Transmission Electron Microscopy Stereo-Pairs</title>
    <abstract language="eng">A great amount of material properties is strongly influenced by dislocations, the carriers of plastic deformation. It is therefore paramount to have appropriate tools to quantify dislocation substructures with regard to their features, e.g., dislocation density, Burgers vectors or line direction. While the transmission electron microscope (TEM) has been the most widely-used equipment implemented to investigate dislocations, it usually is limited to the two-dimensional (2D) observation of three-dimensional (3D) structures. We reconstruct, visualize and quantify 3D dislocation substructure models from only two TEM images (stereo-pairs) and assess the results. The reconstruction is based on the manual interactive tracing of filiform objects on both images of the stereo-pair. The reconstruction and quantification method are demonstrated on dark field (DF) scanning (S)TEM micrographs of dislocation substructures imaged under diffraction contrast conditions. For this purpose, thick regions (&gt; 300 nm) of TEM foils are analyzed, which are extracted from a Ni-base superalloy single crystal after high temperature creep deformation. It is shown how the method allows 3D quantification from stereo-pairs in a wide range of tilt conditions, achieving line length and orientation uncertainties of 3 % and 7°, respectively. Parameters that affect the quality of such reconstructions are discussed.</abstract>
    <identifier type="issn">1438-0064</identifier>
    <identifier type="urn">urn:nbn:de:0297-zib-70339</identifier>
    <enrichment key="SourceTitle">Appeared in: Ultramicroscopy 195 (2018), pp. 157-170</enrichment>
    <enrichment key="PeerReviewed">no</enrichment>
    <author>Leonardo Agudo Jácome</author>
    <submitter>Olaf Paetsch</submitter>
    <author>Hans-Christian Hege</author>
    <author>Olaf Paetsch</author>
    <author>Kai Pöthkow</author>
    <series>
      <title>ZIB-Report</title>
      <number>18-50</number>
    </series>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>dislocation, diffraction contrast, scanning transmission electron microscopy, stereoscopy, visualization</value>
    </subject>
    <collection role="ccs" number="J.">Computer Applications</collection>
    <collection role="pacs" number="70.00.00">CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES</collection>
    <collection role="msc" number="74-00">General reference works (handbooks, dictionaries, bibliographies, etc.)</collection>
    <collection role="institutes" number="vis">Visual Data Analysis</collection>
    <collection role="institutes" number="visalgo">Visual Data Analysis in Science and Engineering</collection>
    <collection role="persons" number="hege">Hege, Hans-Christian</collection>
    <collection role="persons" number="paetsch">Paetsch, Olaf</collection>
    <collection role="projects" number="STEREO">STEREO</collection>
    <collection role="institutes" number="VDcC">Visual and Data-centric Computing</collection>
    <file>https://opus4.kobv.de/opus4-zib/files/7033/zibreport-18-50.pdf</file>
  </doc>
  <doc>
    <id>5985</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">3D Reconstruction, Visualization and Quantification of Dislocations from  Transmission Electron Microscopy Stereo-Pairs</title>
    <parentTitle language="eng">Microscopy and Microanalysis 2016, July 24-28&#13;
Columbus, Ohio</parentTitle>
    <identifier type="url">https://www.microscopy.org/MandM/2016/program/abstracts/PDP-57.pdf</identifier>
    <enrichment key="PeerReviewed">yes</enrichment>
    <author>Leonardo Agudo Jácome</author>
    <submitter>Olaf Paetsch</submitter>
    <author>Hans-Christian Hege</author>
    <author>Olaf Paetsch</author>
    <author>Kai Pöthkow</author>
    <collection role="institutes" number="vis">Visual Data Analysis</collection>
    <collection role="persons" number="hege">Hege, Hans-Christian</collection>
    <collection role="persons" number="paetsch">Paetsch, Olaf</collection>
    <collection role="projects" number="STEREO">STEREO</collection>
    <collection role="institutes" number="VDcC">Visual and Data-centric Computing</collection>
  </doc>
  <doc>
    <id>5874</id>
    <completedYear/>
    <publishedYear>2015</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>16</pageFirst>
    <pageLast>17</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Three-Dimensional Characterization of Superdislocation Interactions in the High Temperature and Low Stress Creep Regime of Ni-Base Superalloy Single Crystals</title>
    <abstract language="eng">Monocrystaline Ni-base superalloys are the material of choice for first row blades in jet engine gas turbines. Using a novel visualization tool for 3D reconstruction and visualization of dislocation line segments from stereo-pairs of scanning transmission electron microscopies, the superdislocation substructures in Ni-base superalloy LEK 94 (crept to ε = 26%) are characterized. Probable scenarios are discussed, how these dislocation substructures form.</abstract>
    <parentTitle language="eng">Proceedings of CREEP 2015 – 13th International Conference on Creep and Fracture of Engineering Materials and Structures, May 31 – June 4, 2015, Toulouse, France</parentTitle>
    <enrichment key="PeerReviewed">no</enrichment>
    <author>Leonardo Agudo Jácome</author>
    <submitter>Hans-Christian Hege</submitter>
    <author>Gunter Eggeler</author>
    <author>Kai Pöthkow</author>
    <author>Olaf Paetsch</author>
    <author>Hans-Christian Hege</author>
    <collection role="institutes" number="vis">Visual Data Analysis</collection>
    <collection role="institutes" number="visalgo">Visual Data Analysis in Science and Engineering</collection>
    <collection role="persons" number="hege">Hege, Hans-Christian</collection>
    <collection role="persons" number="paetsch">Paetsch, Olaf</collection>
    <collection role="projects" number="STEREO">STEREO</collection>
    <collection role="institutes" number="VDcC">Visual and Data-centric Computing</collection>
  </doc>
</export-example>
