@misc{HammerschmidtHerrmannPomplunetal., author = {Hammerschmidt, Martin and Herrmann, Sven and Pomplun, Jan and Burger, Sven and Schmidt, Frank}, title = {Model order reduction for the time-harmonic Maxwell equation applied to complex nanostructures}, series = {Proc. SPIE}, volume = {9742}, journal = {Proc. SPIE}, issn = {1438-0064}, doi = {10.1117/12.2212367}, url = {http://nbn-resolving.de/urn:nbn:de:0297-zib-57239}, pages = {97420M}, abstract = {Fields such as optical metrology and computational lithography require fast and efficient methods for solving the time-harmonic Maxwell's equation. Highly accurate geometrical modeling and numerical accuracy atcomputational costs are a prerequisite for any simulation study of complex nano-structured photonic devices. We present a reduced basis method (RBM) for the time-harmonic electromagnetic scattering problem based on the hp-adaptive finite element solver JCMsuite capable of handling geometric and non-geometric parameter dependencies allowing for online evaluations in milliseconds. We apply the RBM to compute light-scatteringoptical wavelengths off periodic arrays of fin field-effect transistors (FinFETs) where geometrical properties such as the width and height of the fin and gate can vary in a large range.}, language = {en} } @misc{HammerschmidtHerrmannBurgeretal., author = {Hammerschmidt, Martin and Herrmann, Sven and Burger, Sven and Pomplun, Jan and Schmidt, Frank}, title = {Reduced basis method for the optimization of nano-photonic devices}, issn = {1438-0064}, doi = {10.1007/s11082-016-0530-1}, url = {http://nbn-resolving.de/urn:nbn:de:0297-zib-57556}, abstract = {Optical 3D simulations in many-query and real-time contexts require new solution strategies. We study an adaptive, error controlled reduced basis method for solving parametrized time-harmonic optical scattering problems. Application fields are, among others, design and optimization problems of nano-optical devices as well as inverse problems for parameter reconstructions occuring e. g. in optical metrology. The reduced basis method presented here relies on a finite element modeling of the scattering problem with parametrization of materials, geometries and sources.}, language = {en} }