@inproceedings{BeckerXavierPreideletal.2013, author = {Becker, Christiane and Xavier, Jolly and Preidel, Veit and Wyss, Philippe and Sontheimer, Tobias and Rech, Bernd and Probst, J{\"u}rgen and H{\"u}lsen, Christoph and L{\"o}chel, Bernd and Erko, Alexei and Burger, Sven and Schmidt, Frank and Back, Franziska and Rudigier-Voigt, Eveline}, title = {Nanophotonic light trapping in polycrystalline silicon thin-film solar cells using periodically nanoimprint-structured glass substrates}, volume = {8824}, booktitle = {Proc. SPIE}, doi = {10.1117/12.2023871}, pages = {88240D}, year = {2013}, language = {en} } @article{BarthProbstHerrmannetal.2016, author = {Barth, Carlo and Probst, J{\"u}rgen and Herrmann, Sven and Hammerschmidt, Martin and Becker, Christiane}, title = {Numerical characterization of symmetry properties for photonic crystals with hexagonal lattice}, volume = {9885}, journal = {Proc. SPIE}, doi = {10.1117/12.2227094}, pages = {988506}, year = {2016}, abstract = {We present a numerical method to characterize the symmetry properties of photonic crystal (PhC) modes based on field distributions, which themselves can be obtained numerically. These properties can be used to forecast specific features of the optical response of such systems, e.g. which modes are allowed to couple to external radiation fields. We use 2D PhCs with a hexagonal lattice of holes in dielectric as an example and apply our technique to reproduce results from analytical considerations. Further, the method is extended to fully vectorial problems in view of 3D PhCs and PhC slabs, its functionality is demonstrated using test cases and, finally, we provide an efficient implementation. The technique can thus readily be applied to output data of all band structure computation methods or even be embedded - gaining additional information about the mode symmetry.}, language = {en} } @article{SoltwischHaaseWerneckeetal.2016, author = {Soltwisch, Victor and Haase, Anton and Wernecke, Jan and Probst, J{\"u}rgen and Schoengen, Max and Burger, Sven and Krumrey, Michael and Scholze, Frank}, title = {Correlated diffuse x-ray scattering from periodically nanostructured surfaces}, volume = {94}, journal = {Phys. Rev. B}, arxiv = {http://arxiv.org/abs/1509.02003}, doi = {10.1103/PhysRevB.94.035419}, pages = {035419}, year = {2016}, language = {en} } @inproceedings{AgcosBodermannBurgeretal.2015, author = {Agcos, Emil and Bodermann, Bernd and Burger, Sven and Dai, Gaoliang and Endres, Johannes and Hansen, Poul-Erik and Nielson, Lars and Madsen, Morten and Heidenreich, Sebastian and Krumrey, Michael and Loechel, Bernd and Probst, J{\"u}rgen and Scholze, Frank and Soltwisch, Victor and Wurm, Matthias}, title = {Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing}, volume = {9556}, booktitle = {Proc. SPIE}, doi = {10.1117/12.2190409}, pages = {955610}, year = {2015}, language = {en} } @article{BeckerWyssEisenhaueretal.2014, author = {Becker, Christiane and Wyss, Philippe and Eisenhauer, David and Probst, J{\"u}rgen and Preidel, Veit and Hammerschmidt, Martin and Burger, Sven}, title = {5 x 5 cm2 silicon photonic crystal slabs on glass and plastic foil exhibiting broadband absorption and high-intensity near-fields}, volume = {4}, journal = {Sci. Rep.}, doi = {10.1038/srep05886}, pages = {5886}, year = {2014}, language = {en} } @inproceedings{SoltwischWerneckeHaaseetal.2014, author = {Soltwisch, Victor and Wernecke, Jan and Haase, Anton and Probst, J{\"u}rgen and Schoengen, Max and Scholze, Frank and Pomplun, Jan and Burger, Sven}, title = {Determination of line profile on nanostructured surfaces using EUV and x-ray scattering}, volume = {9235}, booktitle = {Proc. SPIE}, doi = {10.1117/12.2066165}, pages = {92351D}, year = {2014}, language = {en} }