@inproceedings{BurgerZschiedrichPomplunetal.2013, author = {Burger, Sven and Zschiedrich, Lin and Pomplun, Jan and Schmidt, Frank}, title = {Finite-element based electromagnetic field simulations: Benchmark results for isolated structures}, volume = {8880}, booktitle = {Proc. SPIE}, arxiv = {http://arxiv.org/abs/1310.2732}, doi = {10.1117/12.2026213}, pages = {88801Z}, year = {2013}, language = {en} } @inproceedings{PomplunBurgerRozovaetal.2011, author = {Pomplun, Jan and Burger, Sven and Rozova, Maria and Zschiedrich, Lin and Schmidt, Frank}, title = {Finite element simulation of optical modes in VCSELs}, booktitle = {Numerical Simulation of Optoelectronic Devices (NUSOD), 11th International Conference on}, doi = {10.1109/NUSOD.2011.6041170}, pages = {119 -- 120}, year = {2011}, language = {en} } @inproceedings{ZschiedrichSchmidtPomplunetal.2016, author = {Zschiedrich, Lin and Schmidt, Frank and Pomplun, Jan and Burger, Sven}, title = {Finite elements for nano-optics applications}, booktitle = {Proc. Europ. Opt. Soc. Ann. Meet. 2016 (EOSAM)}, isbn = {978-1-5108-4796-5}, pages = {178}, year = {2016}, language = {en} } @inproceedings{BarthRoderBrodoceanuetal.2016, author = {Barth, Carlo and Roder, Sebastian and Brodoceanu, Daniel and Kraus, Tobias and Burger, Sven and Hammerschmidt, Martin and Schmidt, Frank and Becker, Christiane}, title = {Increased fluorescence of PbS quantum dots on photonic crystal slab structures}, booktitle = {Proc. Europ. Opt. Soc. Ann. Meet. 2016 (EOSAM)}, isbn = {978-1-5108-4796-5}, pages = {181}, year = {2016}, language = {en} } @inproceedings{HammerschmidtBarthBurgeretal.2016, author = {Hammerschmidt, Martin and Barth, Carlo and Burger, Sven and Becker, Christiane and Schmidt, Frank}, title = {Determining 2D photonic crystal geometries from reflectance spectra with a reduced basis method}, booktitle = {Proc. Europ. Opt. Soc. Ann. Meet. 2016 (EOSAM)}, isbn = {978-1-5108-4796-5}, pages = {281}, year = {2016}, language = {en} } @inproceedings{BeckerXavierPreideletal.2013, author = {Becker, Christiane and Xavier, Jolly and Preidel, Veit and Wyss, Philippe and Sontheimer, Tobias and Rech, Bernd and Probst, J{\"u}rgen and H{\"u}lsen, Christoph and L{\"o}chel, Bernd and Erko, Alexei and Burger, Sven and Schmidt, Frank and Back, Franziska and Rudigier-Voigt, Eveline}, title = {Nanophotonic light trapping in polycrystalline silicon thin-film solar cells using periodically nanoimprint-structured glass substrates}, volume = {8824}, booktitle = {Proc. SPIE}, doi = {10.1117/12.2023871}, pages = {88240D}, year = {2013}, language = {en} } @inproceedings{HammerschmidtLockauBurgeretal.2012, author = {Hammerschmidt, Martin and Lockau, Daniel and Burger, Sven and Schmidt, Frank and Schwanke, Christoph and Kirner, Simon and Calnan, Sonya and Stannowski, Bernd and Rech, Bernd}, title = {3D optical modeling of thin-film a-Si/mc-Si tandem solar cells with random textured interfaces using FEM}, booktitle = {Renewable Energy and the Environment Optics and Photonics Congress}, publisher = {Optical Society of America}, doi = {10.1364/E2.2012.JM5A.15}, pages = {JM5A.15}, year = {2012}, language = {en} } @inproceedings{HohageSchmidtZschiedrich2002, author = {Hohage, Thorsten and Schmidt, Frank and Zschiedrich, Lin}, title = {A new method for the solution of scattering problems}, booktitle = {Proceedings of the JEE'02 Symposium}, editor = {Michielsen, Bas and Decav{\`e}le, Francine}, publisher = {ONERA}, address = {Toulouse}, pages = {251 -- 256}, year = {2002}, language = {en} } @inproceedings{FrieseDeuflhardSchmidt1999, author = {Friese, T. and Deuflhard, Peter and Schmidt, Frank}, title = {A Multigrid Method for the Complex Helmholtz Eigenvalue Problem}, booktitle = {Procs. Eleventh International Conference on Domain Decomposition Methods in Sciences and Engineering (DD11), UK}, editor = {Lai, Choi-Hong and Bj{\o}rstad, Petter E. and Cross, Mark and Widlund, Olof}, publisher = {DDM.org}, pages = {19 -- 26}, year = {1999}, language = {en} } @inproceedings{LockauZschiedrichSchmidtetal.2009, author = {Lockau, D. and Zschiedrich, Lin and Schmidt, Frank and Burger, Sven and Rech, Bernd}, title = {Efficient simulation of plasmonic structures for solar cells}, volume = {XVIII}, booktitle = {International Workshop on Optical Waveguide Theory and Numerical Modelling}, publisher = {Fraunhofer Institute for Applied Optics and Precision Engineering}, pages = {48}, year = {2009}, language = {en} } @inproceedings{LockauZschiedrichBurgeretal.2011, author = {Lockau, D. and Zschiedrich, Lin and Burger, Sven and Schmidt, Frank and Ruske, F. and Rech, Bernd}, title = {Rigorous optical simulation of light management in crystalline silicon thin film solar cells with rough interface textures}, volume = {7933}, booktitle = {Physics and Simulation of Optoelectronic Devices XIX}, publisher = {Proc. SPIE}, doi = {10.1117/12.874967}, pages = {79330M}, year = {2011}, language = {en} } @inproceedings{KettnerSchmidt2011, author = {Kettner, Benjamin and Schmidt, Frank}, title = {The pole condition as transparent boundary condition for resonance problems}, volume = {7933}, booktitle = {Physics and Simulation of Optoelectronic Devices XIX}, publisher = {Proc. SPIE}, doi = {10.1117/12.874752}, pages = {79331B}, year = {2011}, language = {en} } @inproceedings{KloseBurgerSchmidtetal.2005, author = {Klose, Roland and Burger, Sven and Schmidt, Frank and Zschiedrich, Lin}, title = {A multilevel method for the computation of eigenmodes in 3D photonic crystals}, booktitle = {Proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices}, doi = {10.1109/NUSOD.2005.1518135}, pages = {61 -- 62}, year = {2005}, language = {en} } @inproceedings{KleemannKurzHetzleretal.2011, author = {Kleemann, B. and Kurz, J. and Hetzler, J. and Pomplun, Jan and Burger, Sven and Zschiedrich, Lin and Schmidt, Frank}, title = {Fast online inverse scattering with Reduced Basis Method (RBM) for a 3D phase grating with specific line roughness}, volume = {8083}, booktitle = {Modelling Aspects in Optical Metrology III}, publisher = {Proc. SPIE}, doi = {10.1117/12.889364}, pages = {808309}, year = {2011}, language = {en} } @inproceedings{PomplunSchmidt2009, author = {Pomplun, Jan and Schmidt, Frank}, title = {Reduced basis method for fast and robust simulation of electromagnetic scattering problems}, volume = {7390}, booktitle = {Numerical Methods in Optical Metrology}, publisher = {Proc. SPIE}, doi = {10.1117/12.827588}, pages = {73900I}, year = {2009}, language = {en} } @inproceedings{PomplunZschiedrichBurgeretal.2009, author = {Pomplun, Jan and Zschiedrich, Lin and Burger, Sven and Schmidt, Frank}, title = {Reduced basis method for computational lithography}, volume = {7488}, booktitle = {Photomask Technology}, publisher = {Proc. SPIE}, doi = {10.1117/12.829639}, pages = {74882B}, year = {2009}, language = {en} } @inproceedings{PhilippowSchmidt1987, author = {Philippow, E. and Schmidt, Frank}, title = {Besondere L{\"o}sungen in harmonisch erregten Ferroresonanz-Kreisen}, volume = {2}, booktitle = {4. Internationales Symposium Theoretische Elektrotechnik Ilmenau}, pages = {26 -- 32}, year = {1987}, language = {en} } @inproceedings{ScholzeLaubisUlmetal.2008, author = {Scholze, Frank and Laubis, Christian and Ulm, Gerhard and Dersch, Uwe and Pomplun, Jan and Burger, Sven and Schmidt, Frank}, title = {Evaluation of EUV scatterometry for CD characterization of EUV masks using rigorous FEM-simulation}, volume = {6921}, booktitle = {Emerging Lithographic Technologies XII}, editor = {Schellenberg, Frank}, publisher = {SPIE}, year = {2008}, language = {en} } @inproceedings{PomplunBurgerSchmidtetal.2008, author = {Pomplun, Jan and Burger, Sven and Schmidt, Frank and Scholze, Frank and Laubis, Christian and Dersch, Uwe}, title = {Metrology of EUV masks by EUV-scatterometry and finite element analysis}, volume = {7028}, booktitle = {Photomask and Next-Generation Lithography Mask Technology XV}, editor = {Horiuchi, Toshiyuki}, publisher = {SPIE}, year = {2008}, language = {en} } @inproceedings{PomplunBurgerSchmidtetal.2006, author = {Pomplun, Jan and Burger, Sven and Schmidt, Frank and Zschiedrich, Lin and Scholze, Frank}, title = {Rigorous FEM-Simulation of EUV-Masks: Influence of shape and material parameters}, volume = {6349}, booktitle = {Photomask Technology}, editor = {Martin, P. and Naber, R.}, publisher = {Proc. SPIE}, doi = {10.1117/12.686828}, pages = {63493D}, year = {2006}, language = {en} }