@inproceedings{HiremathZschiedrichBurgeretal.2014, author = {Hiremath, Kirankumar and Zschiedrich, Lin and Burger, Sven and Schmidt, Frank}, title = {Finite elements based numerical solution of nonlocal hydrodynamic Drude model of nano-plasmonic scatterers}, booktitle = {12th International Conference on Fiber Optics and Photonics}, doi = {10.1364/PHOTONICS.2014.M3D.4}, pages = {M3D.4}, year = {2014}, language = {en} } @article{BlomeMcPeakBurgeretal.2014, author = {Blome, Mark and McPeak, Kevin and Burger, Sven and Schmidt, Frank and Norris, David}, title = {Back-reflector design in thin-film silicon solar cells by rigorous 3D light propagation modeling}, volume = {33}, journal = {COMPEL: Int. J. Comput. Mathem. Electr. Electron. Eng.}, number = {4}, doi = {10.1108/COMPEL-12-2012-0367}, pages = {1282 -- 1295}, year = {2014}, language = {en} } @article{BeckerWyssEisenhaueretal.2014, author = {Becker, Christiane and Wyss, Philippe and Eisenhauer, David and Probst, J{\"u}rgen and Preidel, Veit and Hammerschmidt, Martin and Burger, Sven}, title = {5 x 5 cm2 silicon photonic crystal slabs on glass and plastic foil exhibiting broadband absorption and high-intensity near-fields}, volume = {4}, journal = {Sci. Rep.}, doi = {10.1038/srep05886}, pages = {5886}, year = {2014}, language = {en} } @inproceedings{ScholzeBodermannBurgeretal.2014, author = {Scholze, Frank and Bodermann, Bernd and Burger, Sven and Endres, Johannes and Haase, Anton and Krumrey, Michael and Laubis, Christian and Soltwisch, Victor and Ullrich, Albrecht and Wernecke, Jan}, title = {Determination of line profiles on photomasks using DUV, EUV and X-ray scattering}, volume = {9231}, booktitle = {Proc. SPIE}, doi = {10.1117/12.2065941}, pages = {92310M}, year = {2014}, language = {en} } @article{KaschkeBlomeBurgeretal.2014, author = {Kaschke, Johannes and Blome, Mark and Burger, Sven and Wegener, Martin}, title = {Tapered N-helical metamaterials with three-fold rotational symmetry as improved circular polarizers}, volume = {22}, journal = {Opt. Expr.}, number = {17}, doi = {10.1364/OE.22.019936}, pages = {19936 -- 19946}, year = {2014}, language = {en} } @article{ShchukinLedentsovJrKroppetal.2014, author = {Shchukin, Vitaly and Ledentsov, Jr., Nikolay and Kropp, J{\"o}rg-R. and Steinle, Gunther and Ledentsov, Jr., Nikolay and Burger, Sven and Schmidt, Frank}, title = {Single-Mode Vertical Cavity Surface Emitting Laser via Oxide-Aperture-Engineering of Leakage of High Order Transverse Modes}, volume = {50}, journal = {IEEE J. Quant. Electron.}, number = {12}, doi = {10.1109/JQE.2014.2364544}, pages = {990 -- 995}, year = {2014}, language = {en} } @inproceedings{SoltwischWerneckeHaaseetal.2014, author = {Soltwisch, Victor and Wernecke, Jan and Haase, Anton and Probst, J{\"u}rgen and Schoengen, Max and Scholze, Frank and Pomplun, Jan and Burger, Sven}, title = {Determination of line profile on nanostructured surfaces using EUV and x-ray scattering}, volume = {9235}, booktitle = {Proc. SPIE}, doi = {10.1117/12.2066165}, pages = {92351D}, year = {2014}, language = {en} } @inproceedings{GschreySeifriedKruegeretal.2014, author = {Gschrey, Manuel and Seifried, Marc and Kr{\"u}ger, Luzy and Schmidt, Ronny and Schulze, Jan-Hindrick and Heindel, Tobias and Burger, Sven and Rodt, Sven and Schmidt, Frank and Strittmatter, Andre and Reitzenstein, Stephan}, title = {Advanced Quantum Light Sources: Modelling and Realization by Deterministic Nanofabrication Technologies}, volume = {IPRSN}, booktitle = {Integrated Photonics Research, Silicon and Nanophotonics}, doi = {10.1364/IPRSN.2014.IW1A.3}, pages = {IW1A.3}, year = {2014}, language = {en} } @inproceedings{WohlfeilStamatiadisJaegeretal.2014, author = {Wohlfeil, Benjamin and Stamatiadis, Christos and J{\"a}ger, Matthias and Zimmermann, Lars and Burger, Sven and Petermann, Klaus}, title = {Integrated optical fiber grating coupler on SOI for the excitation of several higher order fiber modes}, booktitle = {Optical Communication (ECOC), 2014 European Conference on}, doi = {10.1109/ECOC.2014.6963980}, pages = {1 -- 3}, year = {2014}, language = {en} } @inproceedings{WiesendangerBischoffJovanovetal.2014, author = {Wiesendanger, Samuel and Bischoff, Thomas and Jovanov, Vladislav and Knipp, Dietmar and Burger, Sven and Lederer, Falk and Rockstuhl, Carsten}, title = {Numerical investigations on the effects of film growth modes on light trapping in silicon thin film solar cells}, booktitle = {Light, Energy and the Environment}, publisher = {OSA}, doi = {10.1364/PV.2014.PF4C.4}, pages = {PF4C.4}, year = {2014}, language = {en} } @misc{HammerschmidtPomplunBurgeretal.2014, author = {Hammerschmidt, Martin and Pomplun, Jan and Burger, Sven and Schmidt, Frank}, title = {Adaptive sampling strategies for efficient parameter scans in nano-photonic device simulations}, issn = {1438-0064}, doi = {10.1117/12.2036363}, url = {http://nbn-resolving.de/urn:nbn:de:0297-zib-50395}, year = {2014}, abstract = {Rigorous optical simulations are an important tool in optimizing scattering properties of nano-photonic devices and are used, for example, in solar cell optimization. The finite element method (FEM) yields rigorous, time-harmonic, high accuracy solutions of the full 3D vectorial Maxwell's equations [1] and furthermore allows for great flexibility and accuracy in the geometrical modeling of these often complex shaped 3D nano-structures. A major drawback of frequency domain methods is the limitation of single frequency evaluations. For example the accurate computation of the short circuit current density of an amorphous silicon / micro-crystalline multi-junction thin film solar cell may require the solution of Maxwell's equations for over a hundred different wavelengths if an equidistant sampling strategy is employed. Also in optical metrology, wavelength scans are frequently used to reconstruct unknown geometrical and material properties of optical systems numerically from measured scatterometric data. In our contribution we present several adaptive numerical integration and sampling routines and study their efficiency in the context of the determination of generation rate profiles of solar cells. We show that these strategies lead to a reduction in the computational effort without loss of accuracy. We discuss the employment of tangential information in a Hermite interpolation scheme to achieve similar accuracy on coarser grids. We explore the usability of these strategies for scatterometry and solar cell simulations.}, language = {en} } @inproceedings{GschreySeifriedKruegeretal.2014, author = {Gschrey, Manuel and Seifried, Marc and Kr{\"u}ger, Luzy and Schmidt, Ronny and Schulze, Jan-Hindrick and Heindel, Tobias and Burger, Sven and Rodt, Sven and Schmidt, Frank and Strittmatter, Andre and Reitzenstein, Stephan}, title = {Boosting the photon-extraction efficiency of nanophotonic structures by deterministic microlenses}, booktitle = {CLEO: 2014}, publisher = {Optical Society of America}, doi = {10.1364/CLEO_QELS.2014.FF2K.2}, pages = {FF2K.2}, year = {2014}, language = {en} } @article{WiesendangerBischoffJovanovetal.2014, author = {Wiesendanger, Samuel and Bischoff, Thomas and Jovanov, Vladislav and Knipp, Dietmar and Burger, Sven and Lederer, Falk and Rockstuhl, Carsten}, title = {Effects of film growth modes on light trapping in silicon thin film solar cells}, volume = {104}, journal = {Appl. Phys. Lett.}, number = {23}, doi = {10.1063/1.4882997}, pages = {231103}, year = {2014}, language = {en} } @misc{AmiranashviliBandelowBlomeetal.2014, author = {Amiranashvili, Shalva and Bandelow, Uwe and Blome, Mark and Burger, Sven and Schmidt, Frank and Schmidt, Kersten and Zschiedrich, Lin}, title = {Nanophotonics and nonlinear fiber optics}, volume = {1}, journal = {MATHEON-Mathematics for Key Technologies}, editor = {Deuflhard, Peter and et al.,}, publisher = {European Mathematical Society}, doi = {10.4171/137}, pages = {257 -- 275}, year = {2014}, language = {en} } @article{MenzelHebestreitAlaeeetal.2014, author = {Menzel, Christoph and Hebestreit, Erik and Alaee, Rasoul and Albooyeh, Mohammad and M{\"u}hlig, Stefan and Burger, Sven and Rockstuhl, Carsten and Simovski, Constantin and Tretyakov, Sergei and Lederer, Falk and Pertsch, Thomas}, title = {Extreme Coupling: a route towards local magnetic metamaterials}, volume = {89}, journal = {Phys. Rev. B}, doi = {10.1103/PhysRevB.89.155125}, pages = {155125}, year = {2014}, language = {en} } @article{MenzelHebestreitMuehligetal.2014, author = {Menzel, Christoph and Hebestreit, Erik and M{\"u}hlig, Stefan and Rockstuhl, Carsten and Burger, Sven and Lederer, Falk and Pertsch, Thomas}, title = {The spectral shift between near- and far-field resonances of optical nano-antennas}, volume = {22}, journal = {Opt. Expr.}, number = {8}, doi = {10.1364/OE.22.009971}, pages = {9971 -- 9982}, year = {2014}, language = {en} } @article{McPeakvanEngersBlomeetal.2014, author = {McPeak, Kevin and van Engers, Christian D. and Blome, Mark and Park, Jong Hyuk and Burger, Sven and Gosalvez, Miguel A. and Faridi, Ava and Ries, Yasmina and Sahu, Ayaskanta and Norris, David}, title = {Complex Chiral Colloids and Surfaces via High-Index Off-Cut Silicon}, volume = {14}, journal = {Nano Lett.}, number = {5}, doi = {10.1021/nl501032j}, pages = {2934 -- 2940}, year = {2014}, language = {en} } @inproceedings{BurgerZschiedrichPomplunetal.2013, author = {Burger, Sven and Zschiedrich, Lin and Pomplun, Jan and Schmidt, Frank}, title = {Finite-element based electromagnetic field simulations: Benchmark results for isolated structures}, volume = {8880}, booktitle = {Proc. SPIE}, arxiv = {http://arxiv.org/abs/1310.2732}, doi = {10.1117/12.2026213}, pages = {88801Z}, year = {2013}, language = {en} } @article{EndresBurgerWurmetal.2013, author = {Endres, Johannes and Burger, Sven and Wurm, Matthias and Bodermann, Bernd}, title = {Numerical investigations of the influence of different commonly applied approximations in scatterometry}, volume = {8789}, journal = {Proc. SPIE}, doi = {10.1117/12.2022108}, pages = {878904}, year = {2013}, language = {en} } @article{SoltwischBurgerScholze2013, author = {Soltwisch, Victor and Burger, Sven and Scholze, Frank}, title = {Scatterometry sensitivity analysis for conical diffraction versus in-plane diffraction geometry with respect to the side wall angle}, volume = {8789}, journal = {Proc. SPIE}, doi = {10.1117/12.2020487}, pages = {878905}, year = {2013}, language = {en} }