TY - CONF A1 - Pomplun, Jan A1 - Schmidt, Frank T1 - Reduced basis method for fast and robust simulation of electromagnetic scattering problems T2 - Numerical Methods in Optical Metrology Y1 - 2009 UR - https://opus4.kobv.de/opus4-zib/frontdoor/index/index/docId/2314 VL - 7390 SP - 73900I PB - Proc. SPIE ER -