New Methods for Improving Embedded Memory Manufacturing Tests

  • Due to the need for fast and energy-efficient accesses to growing amounts of data, the share and number of embedded memories inside modern microchips has been continuously increasing within the last years. Since embedded memories have the highest integration density of a fabrication technology they pose special test challenges due to complex manufacturing defects as well as strong transistor aging phenomena. This necessitates efficient methods for detecting more subtle defects while keeping test costs low. This work presents novel methods and techniques for improving the efficiency of embedded memory manufacturing tests. The proposed methods are demonstrated in an industrial setting based on production-proven transistor, memory as well as chip models and their benefits over the current state-of-the art is worked out.

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Author:Josef Kinseher
URN:urn:nbn:de:bvb:739-opus4-6017
Advisor:Ilia Polian
Document Type:Doctoral Thesis
Language:English
Year of Completion:2018
Date of Publication (online):2019/01/09
Date of first Publication:2019/01/09
Publishing Institution:Universität Passau
Granting Institution:Universität Passau, Fakultät für Informatik und Mathematik
Date of final exam:2018/09/05
Release Date:2019/01/09
Pagenumber:119 Seiten
Institutes:Fakultät für Informatik und Mathematik
Dewey Decimal Classification:0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 000 Informatik, Informationswissenschaft, allgemeine Werke
open_access (DINI-Set):open_access
Licence (German):License LogoStandardbedingung laut Einverständniserklärung