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Structural and Optical Anomalies in Thin Films Grown in a Magnetic Field by Electron-Assisted Vacuum Deposition of PTFE

  • Polytetrafluoroethylene (PTFE) films are deposited in parallel and perpendicular magnetic fields (MF) by electron-enhanced vacuum deposition (EVD) and EVD + low-temperature plasma (LTP) methods. The structure, morphology, and nanomechanical properties of the films are studied by infrared spectroscopy (IRS), atomic force microscopy (AFM), and spectroscopic ellipsometry. The structure of the thicker films is closer to that of bulk PTFE than that of thin films. The films' crystallinity and surface roughness are higher than those deposited without MF. The birefringence of the refractive index (n) of the films deposited in the MF is inverse to the anisotropy of the n of the films deposited without MF. The hardness of the films is close to that of bulk PTFE.

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URN:urn:nbn:de:kobv:526-opus4-19712
Publisher DOI:https://doi.org/10.1002/mame.202400332
Author:Viachaslau KsianzouORCiD, Claus VillringerORCiD, Kostyantyn GrytsenkoORCiD, Demyd PekurORCiD, Peter LytvynORCiD, Mykola Sopinskyy, Iryna LebedyevaORCiD, Agata NiemczykORCiD, Jolanta BaranowskaORCiD
Parent Title (English):Macromolecular Materials and Engineering
Document Type:Article
Language:English
Year of Publication:2025
Volume:310
Issue:3
Article Number:2400332
Publisher:Wiley
Faculties an central facilities:Fachbereich Ingenieur- und Naturwissenschaften
Publishing Institution:Technische Hochschule Wildau
Tag:birefringence; deposition in vacuum; morphology; plasma; thin polytetrafluoroethylene film
Source:V. Ksianzou, C. Villringer, K. Grytsenko, D. Pekur, P. Lytvyn, M. Sopinskyy, I. Lebedyeva, A. Niemczyk, J. Baranowska, Structural and Optical Anomalies in Thin Films Grown in a Magnetic Field by Electron-Assisted Vacuum Deposition of PTFE. Macromol. Mater. Eng. 2025, 310, 2400332. https://doi.org/10.1002/mame.202400332
Dewey Decimal Classification:6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 621 Angewandte Physik
Funding:Publikationsfonds der TH Wildau
Licence (German):Creative Commons - CC BY - Namensnennung 4.0 International
Release Date:2025/03/13
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