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Triangulation-based 3D surveying borescope

  • In this work, a measurement concept based on triangulation was developed for borescopic 3D-surveying of surface defects. The integration of such measurement system into a borescope environment requires excellent space utilization. The triangulation angle, the projected pattern, the numerical apertures of the optical system, and the viewing angle were calculated using partial coherence imaging and geometric optical raytracing methods. Additionally, optical aberrations and defocus were considered by the integration of Zernike polynomial coefficients. The measurement system is able to measure objects with a size of 50 μm in all dimensions with an accuracy of ± 5 μm. To manage the issue of a low depth of field while using an optical high resolution system, a wavelength dependent aperture was integrated. Thereby, we are able to control depth of field and resolution of the optical system and can use the borescope in measurement mode with high resolution and low depth of field or in inspection mode with low resolution and higher depth of field. First measurements of a demonstrator system are in good agreement with our simulations.

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Author:Silvio Pulwer, Patrick SteglichORCiD, Claus VillringerORCiD, Joachim Bauer, Martin BurgerORCiD, M. Franz, K. Grieshober, F. Wirth, J. Blondeau, J. Rautenberg, S. Mouti, Sigurd SchraderORCiD
URN:urn:nbn:de:kobv:526-opus4-15307
DOI (Version of Record):https://doi.org/10.1117/12.2225203
Publisher:SPIE
Document Type:Conference Proceeding
Language:English
Year of Publication:2016
Publishing Institution:Technische Hochschule Wildau
Release Date:2021/09/17
Tag:3D measurement; borescope; calibration; defect; lens design; triangulation
First Page:51
Last Page:56
Source:S. Pulwer, P. Steglich, C. Villringer, J. Bauer, M. Burger, M. Franz, K. Grieshober, F. Wirth, J. Blondeau, J. Rautenberg, S. Mouti, and S. Schrader "Triangulation-based 3D surveying borescope", Proc. SPIE 9890, Optical Micro- and Nanometrology VI, 989009 (26 April 2016); https://doi.org/10.1117/12.2225203
Copyright:Copyright 2016 Society of Photo-Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Faculties an central facilities:Fachbereich Ingenieur- und Naturwissenschaften
Dewey Decimal Classification:6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 620 Ingenieurwissenschaften und zugeordnete Tätigkeiten
Licence (German):Das Dokument ist urheberrechtlich geschützt
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