TY - JOUR A1 - Steglich, Patrick A1 - Villringer, Claus A1 - Dietzel, Birgit A1 - Mai, Christian A1 - Schrader, Sigurd A1 - Casalboni, Mauro A1 - Mai, Andreas T1 - On-Chip Dispersion Measurement of the Quadratic Electro-Optic Effect in Nonlinear Optical Polymers Using a Photonic Integrated Circuit Technology JF - IEEE Photonics Journal N2 - A novel method to determine the dispersion of the quadratic electro-optic effect in nonlinear optical materials by using a silicon-on-insulator microring resonator is presented. The microring consists of a silicon slot waveguide enabling large dc electric field strength at low applied voltages. The dispersion of third-order hyperpolarizability of a linear conjugated dye is approximated by using a two-level model for the off-resonant spectral region. As an example, the dispersion of the resonance wavelength of the resonator filled with a dye doped polymer was measured in dependence of the applied dc voltage. The polymer was poly (methylmethacrylate) doped with 5 wt% disperse red 1 (DR1), and the measurements have been carried out at the telecommunication wavelength band around 1550 nm (optical C-band). The described measurements represent a new technique to determine the dispersion of the third-order susceptibility and molecular hyperpolarizability of the material filled into the slot of the ring-resonator. KW - electro-optical device KW - nonlinear optics KW - integrated optics KW - integrated optics material KW - optical material KW - integrated optics device KW - polymer active device Y1 - 2019 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:526-opus4-12307 SN - 1943-0655 VL - 11 IS - 3 ER - TY - JOUR A1 - Bauer, Joachim A1 - Fursenko, Oksana A1 - Heinrich, Friedhelm A1 - Gutke, Marko A1 - Kornejew, Eckhart A1 - Brödel, Oliver A1 - Dietzel, Birgit A1 - Kaltenbach, Alexander A1 - Burkhardt, Martin A1 - Edling, Matthias A1 - Steglich, Patrick A1 - Herzog, Michael A1 - Schrader, Sigurd T1 - Determination of optical constants and scattering properties of transparent polymers for use in optoelectronics JF - Optical Materials Express N2 - Knowledge of optical constants, i.e. refractive index n and extinction coefficient k, and light scattering properties of optical polymers are required to optimize micro-optics for light-emitting diodes in terms of efficiency, color properties and light distribution. We present here a model-based diagnostic approach to determine the optical properties of polymers, which should be particularly useful in the development of plastics for optical applications. Optical constants and scattering coefficients were obtained from transmission and reflection measurements in a wavelength range from UV to NIR taking into account scattering effects due to rough surfaces and volume inhomogeneity. Based on the models for the dielectric function, the molecular optical transition energies Eg, critical point energies, Urbach energies and exciton transition energies were determined. Rayleigh and Mie scattering model and van de Hulst's anomalous diffraction theory were applied to characterize scattering due to volume inhomogeneities. Scalar diffraction theory was applied to account for surface roughness scattering. Atomic force microscopy with nanomechanical characterization was used to characterize domains in size and shape and to assign optical scattering to a suitable morphological model. The combined optical and mechanical characterization help to improve the qualification of new polymer materials for optical applications. KW - diffraction theory KW - light property KW - optical constant KW - optical material KW - optical property KW - scattering theory Y1 - 2022 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:526-opus4-15666 VL - 12 IS - 1 SP - 204 EP - 224 PB - Optica Publishing Group ER -