Refine
Year of publication
Document Type
- Other (11)
- Conference Proceeding (10)
- Article (peer reviewed) (5)
- Report (4)
- Contribution to a Periodical (3)
- Part of a Book (1)
Has Fulltext
- no (34)
Is part of the Bibliography
- no (34)
Keywords
- Thin Film Transistors (9)
- Case Study (7)
- Software (3)
- Möbelproduktion (2)
- Semiconductor Industry (2)
- Supply Chains (2)
- Thin film transistors (2)
- Amorphous materials (1)
- Amorphous semiconductors (1)
- Amorphous silicon (1)
Institute
Transfer learning (TL) is an emerging field in modeling building thermal dynamics. This method reduces the data required for a data-driven model of a target building by leveraging knowledge from a source building. Consequently, it enables the creation of data-efficient models that can be used for advanced control and fault detection & diagnosis. A major limitation of the TL approach is its inconsistent performance across different sources. Although accurate source-building selection for a target is crucial, it remains a persistent challenge.
We present GenTL, a general transfer learning model for single-family houses in Central Europe. GenTL can be efficiently fine-tuned to a large variety of target buildings. It is pretrained on a Long Short-Term Memory (LSTM) network with data from 450 different buildings. The general transfer learning model eliminates the need for source-building selection by serving as a universal source for fine-tuning. Comparative analysis with conventional single-source to single-target TL demonstrates the efficacy and reliability of the general pretraining approach. Testing GenTL on 144 target buildings for fine-tuning reveals an average prediction error (RMSE) reduction of 42.1% compared to fine-tuning single-source models.