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Seliger, Norbert
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Wachutka, G.
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Gornik, E.
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Thalhammer, R.
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Pogany, D.
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Deboy, G.
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Fürböck, C.
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DC/DC converter
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IGBT
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backside laserprobing
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heel crack
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reliability
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thermal management
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wire bond
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Fakultät für Ingenieurwissenschaften
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Author
Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik
(1997)
Fuerboeck, C.
;
Thalhammer, R.
;
Seliger, Norbert
;
Pogany, D.
;
Deboy, G.
;
Wachutka, G.
;
Gornik, E.
Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Deboy, G.
;
Gornik, E.
;
Wachutka, G.
Reliability model for Al wire bonds subjected to heel crack failures
(2000)
Ramminger, S.
;
Seliger, Norbert
;
Wachutka, G.
Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Gornik, E.
;
Wachutka, G.
A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices
(1999)
Fürböck, C.
;
Thalhammer, R.
;
Litzenberger, M.
;
Seliger, Norbert
;
Pogany, D.
;
Gornik, E.
;
Wachutka, G.
Efficient calculation of transient temperature fields responding to fast changing heatsources over long duration in high frequency DC/DC converter
(2002)
Gerstenmaier, Y.C.
;
Wachutka, G.
;
Seliger, Norbert
A study of heel crack failures in wire bonds under mechanical cycling
(2000)
Seliger, Norbert
;
Ramminger, S.
;
Franke, T.
;
Wachutka, G.
Internal Characterisation of IGBTs Using the Backside Laserprober Technique
(1999)
Fürböck, C.
;
Thalhammer, R.
;
Litzenberger, M.
;
Seliger, Norbert
;
Pogany, D.
;
Gornik, E.
;
Wachutka, G.
1
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8