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Institute
A DDR3 SDRAM test setup implemented on the Griffin III test system from HILEVEL Technologies is used to analyse the row hammer bug. Row hammer pattern experiments are compared to standard retention tests for different manufacturing technologies. The row hammer effect is depending on the number of stress activation cycles. The analysis is extended to an avoidance scheme with refreshes similar to the Target Row Refresh scheme for the DDR4 SDRAM technology.
A novel approach to optically distinguish plastics based on fluorescence lifetime measurements
(2020)
In medical and biological research, fluorescence lifetime measurements and fluorescence lifetime imaging is already a part of the standardized analysis procedures. As first investigations have shown, polymers can be identified using fluorescence lifetime imaging and an evaluation algorithm. Thus, this contribution pursues a novel approach for the direct differentiation of four polymers with fluorescence lifetime imaging. Therefore, the evaluation algorithm is extended to compare several fluorescence lifetime images to prove that a distinction is possible.
A novel approach to optically distinguish plastics based on fluorescence lifetime measurements
(2020)
Nowadays, fluorescence lifetime measurements and the method of fluorescence lifetime imaging are already state of the art in biomedical research. Also first investigations show that polymers could be identified due to their endogenous fluorescent lifetime. Thus an approach of identifying polymers with fluorescence lifetime imaging is done in this contribution. Therefore, four different polymers are examined and evaluated with statistical methods in order to determine their specific fluorescence lifetimes.
Today, the automatic separation of polymers from each other in an industrial scale is an unsolved problem. In laboratory environments, two methods are known whereby plastic is sorted either by color or by fluorescence decay time measurements that require fast synchronization and thus expensive equipment. A simple and pragmatic process is proposed to separate plastics from each other: all fluorescent photons are counted in relation to the absorbed photons. A theoretical model and an experimental setup are built in order to determine an apparatus specific quantum efficiency.
A DDR2 SDRAM test setup implemented on the Griffin III ATE test system from HILEVEL Technologies is used to analyse the row hammer bug. Row hammer pattern experiments are compared to standard retention tests.
The analysis confirms that the row hammer effect is caused by a charge excitation process depending on the number of stress activation cycles. The stress has to occur in the local neighborhood of the cells under test.
Shallow impurity levels support the responsible charge carrier transport process in the used DDR2 SDRAM technology
Reference design projects are implemented to the Xilinx Zynq on the Zedboard which is extended by user defined electronic hardware connected through the Zedboard's FMC (FPGA Mezzanine Card) connector. The implementation method with HDL Workflow Advisor includes constraint definitions for modified reference design projects for use with digital input and outputs and Zynq's XADC (Analog-Digital converter) which is characterized and compared to its data sheet. The bandwidth of the Zynq's internal AXI (Advanced eXtensible Interface) bus connected to the Simulink host PC is determined.
A DDR2 DRAM test setup is developed and implemented on the Griffin III ATE test system from HILEVEL Technologies. The test system provides a raw platform for performing various mixed signal and digital tests. In order to configure patterns easily in a vector format, a software platform is developed to manage test patterns according to the user's analysis needs. As examples, retention test patterns with disabled self-refresh are applied to 2 Gbit DDR2 SDRAM of two different DRAM vendors. The devices are characterized in respect to their intrinsic leakage and data retention behavior under the influence of stress conditions such as temperature or access algorithm. The tests are automated and test data is logged for an off-line data analysis. Data is recorded before and after solder simulation steps in order to observe a retention time degradation.