Refine
Year of publication
Document Type
Language
- English (30) (remove)
Has Fulltext
- no (30)
Is part of the Bibliography
- no (30)
Keywords
- Microelectronics (6)
- fluorescence (5)
- Fluorescence lifetime imaging (3)
- Image processing algorithms (3)
- Phase shift (3)
- Diode lasers (2)
- FD-FLIM (2)
- Image processing (2)
- polymer (2)
- wood (2)
Institute
- Fakultät für Ingenieurwissenschaften (30) (remove)
A parallel design concept of Delta-Sigma modulators that optimizes the resolution and the bandwidth for a highly dynamic position control in industrial applications. The idea is realized on a printed circuit board and tested by using a comprehensive measurement setup. The effective number of bits is increased by 2.5 bits at a fixed frequency. For a constant resolution, the design approach allows smaller filter lengths and a decrease of the delay by 25%.
A Novel Approach to Identify Wood Species Optically using Fluorescence Lifetime Imaging Microscopy
(2021)
This contribution presents the results obtained with fluorescence lifetime imaging microscopy (FLIM)within the optical identification and differentiation of the four wood species walnut, beech, spruce, and maple. The experimental setup as well as the evaluation algorithm, with which the experiments were carried out, is explained briefly.
For sustainable handling of wood and high material utilization, post-consumer wood has to be sorted by post-consumer wood categories in Germany. The non-destructive FD-FLIM method could improve the wood recycling process by automatic classification of waste wood into post-consumer wood classes. Thus, the phase-dependent fluorescence decay time of treated wood is analysed in this study to obtain the impact of the treatment on the fluorescence decay time. It is shown that treated and untreated wood can be differentiated using the fluorescence decay time, although the state-of-the-art theoretical fluorescence decay time differs from the experimentally determined fluorescence decay time.
In this contribution the frequency domain fluorescence lifetime imaging microscopy (FD-FLIM) technique is evaluated for post-consumer wood sorting. The fluorescence characteristics of several wood samples were determined, whereby two excitation wavelengths (405 and 488 nm) were used. The measured data were processed using algorithmic methods to identify the wood species and post-consumer wood category. With the excitation wavelength of 405 nm, 16 out of 19 samples could be correctly assigned to the corresponding post-consumer wood category by means of the fluorescence lifetimes. Thus, the experimental results revealed the high potential of the FD-FLIM technique for automated post-consumer wood sorting.
Comprehensive guide to the process and test methods used for electronic device failure analysis. Contains dozens of articles—contributed by industry experts—covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips.
Topic coverage includes:
Failure Analysis Process Flow
Failure Verification
Failure Modes and Failure Classification
Special Devices (MEMS, Optoelectronics, Passives)
Fault Localization Techniques: Package Level (NDT)
Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods)
Deprocessing & Imaging Techniques: Deprocessing
General Imaging Techniques
Local Deprocessing & Imaging
Circuit Edit and Design Modification
Material Analysis Techniques
Reference Information: Important Topics for Semiconductor Devices
Failure Analysis Techniques Roadmap
Failure Analysis Operations and Management
Appendices: Failure Analysis Terms, Definitions, and Acronyms
Industry Standards