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Stoisiek, M. (3)
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1998
(2)
1997
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Article (peer reviewed)
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English
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Fakultät für Ingenieurwissenschaften
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Characterisation of Semiconductor Devices by Infrared Laser Interferometry
(1998)
Seliger, Norbert
;
Gornik, E.
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Thalhammer, R.
;
Stoisiek, M.
Analysis of the temperature evolution from the time resolved thermo-optical interferometric measurements with few Fabry-Perot peaks
(1998)
Pogany, D.
;
Seliger, Norbert
;
Gornik, E.
;
Stoisiek, M.
;
Lalinsky, T.
A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry
(1997)
Seliger, Norbert
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Gornik, E.
;
Stoisiek, M.
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