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Wachutka, G. (8)
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2002
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2000
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1998
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Conference Proceeding
(7)
Article (peer reviewed)
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English
(8)
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(8)
Keywords
DC/DC converter
(1)
IGBT
(1)
backside laserprobing
(1)
heel crack
(1)
reliability
(1)
thermal management
(1)
wire bond
(1)
Institute
Fakultät für Ingenieurwissenschaften
(8)
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Author
Internal Characterisation of IGBTs Using the Backside Laserprober Technique
(1999)
Fürböck, C.
;
Thalhammer, R.
;
Litzenberger, M.
;
Seliger, Norbert
;
Pogany, D.
;
Gornik, E.
;
Wachutka, G.
Efficient calculation of transient temperature fields responding to fast changing heatsources over long duration in high frequency DC/DC converter
(2002)
Gerstenmaier, Y.C.
;
Wachutka, G.
;
Seliger, Norbert
A study of heel crack failures in wire bonds under mechanical cycling
(2000)
Seliger, Norbert
;
Ramminger, S.
;
Franke, T.
;
Wachutka, G.
A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices
(1999)
Fürböck, C.
;
Thalhammer, R.
;
Litzenberger, M.
;
Seliger, Norbert
;
Pogany, D.
;
Gornik, E.
;
Wachutka, G.
Reliability model for Al wire bonds subjected to heel crack failures
(2000)
Ramminger, S.
;
Seliger, Norbert
;
Wachutka, G.
Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Deboy, G.
;
Gornik, E.
;
Wachutka, G.
Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Gornik, E.
;
Wachutka, G.
Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik
(1997)
Fuerboeck, C.
;
Thalhammer, R.
;
Seliger, Norbert
;
Pogany, D.
;
Deboy, G.
;
Wachutka, G.
;
Gornik, E.
1
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