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Author
Thalhammer, R. (6)
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Year of publication
1999
(2)
1998
(3)
1997
(1)
Document Type
Conference Proceeding
(5)
Article (peer reviewed)
(1)
Language
English
(6)
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no
(6)
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(6)
Keywords
IGBT
(1)
backside laserprobing
(1)
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Fakultät für Ingenieurwissenschaften
(6)
6
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Internal Characterisation of IGBTs Using the Backside Laserprober Technique
(1999)
Fürböck, C.
;
Thalhammer, R.
;
Litzenberger, M.
;
Seliger, Norbert
;
Pogany, D.
;
Gornik, E.
;
Wachutka, G.
A differential backside laserprobing technique for the investigation of the lateral temperature distribution in power devices
(1999)
Fürböck, C.
;
Thalhammer, R.
;
Litzenberger, M.
;
Seliger, Norbert
;
Pogany, D.
;
Gornik, E.
;
Wachutka, G.
Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Deboy, G.
;
Gornik, E.
;
Wachutka, G.
Characterisation of Semiconductor Devices by Infrared Laser Interferometry
(1998)
Seliger, Norbert
;
Gornik, E.
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Thalhammer, R.
;
Stoisiek, M.
Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Gornik, E.
;
Wachutka, G.
Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik
(1997)
Fuerboeck, C.
;
Thalhammer, R.
;
Seliger, Norbert
;
Pogany, D.
;
Deboy, G.
;
Wachutka, G.
;
Gornik, E.
1
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6