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Author
Ramminger, S. (3)
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Year of publication
2007
(1)
2000
(2)
Document Type
Conference Proceeding
(2)
Article (peer reviewed)
(1)
Language
English
(3)
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no
(3)
Is part of the Bibliography
no
(3)
Keywords
HEV
(1)
High-Temperature Electronics
(1)
Reliability
(1)
heel crack
(1)
reliability
(1)
wire bond
(1)
Institute
Fakultät für Ingenieurwissenschaften
(3)
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Reliability of high temperature inverters for HEV
(2007)
Renken, F.
;
Ehbauer, G.
;
Karrer, V.
;
Knorr, R.
;
Ramminger, S.
;
Seliger, Norbert
;
Wolfgang, E.
A study of heel crack failures in wire bonds under mechanical cycling
(2000)
Seliger, Norbert
;
Ramminger, S.
;
Franke, T.
;
Wachutka, G.
Reliability model for Al wire bonds subjected to heel crack failures
(2000)
Ramminger, S.
;
Seliger, Norbert
;
Wachutka, G.
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