Deutsch
Login
Open Access
Home
Search
Browse
Publish
FAQ
Refine
Author
Fuerboeck, C. (9)
(remove)
Year of publication
1998
(4)
1997
(5)
Document Type
Conference Proceeding
(5)
Article (peer reviewed)
(3)
Part of a Book
(1)
Language
English
(9)
Has Fulltext
no
(9)
Is part of the Bibliography
no
(9)
Institute
Fakultät für Ingenieurwissenschaften
(9)
9
search hits
1
to
9
Export
BibTeX
CSV
RIS
XML
10
10
20
50
100
Sort by
Year
Year
Title
Title
Author
Author
Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Deboy, G.
;
Gornik, E.
;
Wachutka, G.
Characterisation of Semiconductor Devices by Infrared Laser Interferometry
(1998)
Seliger, Norbert
;
Gornik, E.
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Thalhammer, R.
;
Stoisiek, M.
Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Gornik, E.
;
Wachutka, G.
Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices
(1998)
Fuerboeck, C.
;
Seliger, Norbert
;
Pogany, D.
;
Litzenberger, M.
;
Gornik, E.
;
Stecher, M.
;
Gosser, H.
;
Werner, W.
Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices
(1997)
Seliger, Norbert
;
Fuerboeck, C.
;
Habas, P.
;
Pogany, D.
;
Gornik, E.
Optical Testing of submicron-technology MOSFETs and bipolar transistors
(1997)
Pogany, D.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
;
Kubicek, S.
;
Decoutere, S.
A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry
(1997)
Seliger, Norbert
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Gornik, E.
;
Stoisiek, M.
A laser beam method for evaluation of thermal time constant in smart power devices
(1997)
Seliger, Norbert
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Gornik, E.
Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik
(1997)
Fuerboeck, C.
;
Thalhammer, R.
;
Seliger, Norbert
;
Pogany, D.
;
Deboy, G.
;
Wachutka, G.
;
Gornik, E.
1
to
9