Reliability of high temperature inverters for HEV
| Author: | F. Renken, G. Ehbauer, V. Karrer, R. Knorr, S. Ramminger, Norbert SeligerORCID, E. Wolfgang |
|---|---|
| DOI: | https://doi.org/10.1109/PCCON.2007.373022 |
| Parent Title (English): | Proceedings Power Conversion Conference |
| Publisher: | IEEE |
| Place of publication: | Nagoya |
| Document Type: | Conference Publication |
| Language: | English |
| Publication Year: | 2007 |
| Release Date: | 2023/06/15 |
| Tag: | HEV; High-Temperature Electronics; Reliability |
| First Page: | 563 |
| Last Page: | 568 |
| Peer reviewed: | Ja |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
| Dewey Decimal Classification: | 6 Technik, Medizin, angewandte Wissenschaften / 60 Technik / 600 Technik, Technologie |
