Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices
| Author: | D. Pogany, Norbert SeligerORCID, M. Litzenberger, H. Gossner, M. Stecher, T. Müller-Lynch, W. Werner, E. Gornik |
|---|---|
| DOI: | https://doi.org/10.1016/S0026-2714(99)00162-6 |
| ISSN: | 0026-2714 |
| Parent Title (German): | Microelectronics Reliability |
| Document Type: | Article (peer reviewed) |
| Language: | English |
| Publication Year: | 1999 |
| Release Date: | 2023/06/09 |
| Volume: | 39 |
| Issue: | 6 |
| Page Number: | 6 |
| First Page: | 1143 |
| Last Page: | 1148 |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
