Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress
| Author: | C. Fürböck, M. Litzenberger, D. Pogany, E. Gornik, Norbert SeligerORCID, T. Müller-Lynch, M. Stecher, H. Goßner, W. Werner |
|---|---|
| DOI: | https://doi.org/10.1016/S0026-2714(99)00124-9 |
| ISSN: | 0026-2714 |
| Parent Title (German): | Microelectronics Reliability |
| Document Type: | Article (peer reviewed) |
| Language: | English |
| Publication Year: | 1999 |
| Release Date: | 2023/06/09 |
| Volume: | 39 |
| Issue: | 6 |
| Page Number: | 6 |
| First Page: | 925 |
| Last Page: | 930 |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
