Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing
| Author: | Norbert SeligerORCID, P. Habas, D. Pogany, E. Gornik |
|---|---|
| DOI: | https://doi.org/10.1016/S0038-1101(97)00131-7 |
| Parent Title (English): | Solid-State Electronics |
| Document Type: | Article (peer reviewed) |
| Language: | English |
| Publication Year: | 1997 |
| Release Date: | 2023/06/09 |
| Volume: | 41 |
| Issue: | 9 |
| Page Number: | 8 |
| First Page: | 1285 |
| Last Page: | 1292 |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
