Optical Testing of submicron-technology MOSFETs and bipolar transistors
| Author: | D. Pogany, C. Fuerboeck, Norbert SeligerORCID, P. Habas, E. Gornik, S. Kubicek, S. Decoutere |
|---|---|
| URL: | https://ieeexplore.ieee.org/document/1503373 |
| Parent Title (English): | European Solid-State Device Research Conference (ESSDERC' 97) |
| Editor: | H. Grünbacher |
| Document Type: | Conference Publication |
| Language: | English |
| Publication Year: | 1997 |
| Release Date: | 2023/06/09 |
| Page Number: | 4 |
| First Page: | 372 |
| Last Page: | 375 |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
