A laser beam method for evaluation of thermal time constant in smart power devices
| Author: | Norbert SeligerORCID, D. Pogany, C. Fuerboeck, P. Habas, E. Gornik |
|---|---|
| DOI: | https://doi.org/10.1016/S0026-2714(97)00149-2 |
| Parent Title (English): | Microelectronics Reliability |
| Document Type: | Article (peer reviewed) |
| Language: | English |
| Publication Year: | 1997 |
| Release Date: | 2023/06/09 |
| Volume: | 37 |
| Issue: | 10/11 |
| Page Number: | 4 |
| First Page: | 1727 |
| Last Page: | 1730 |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
