Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique
| Author: | Norbert SeligerORCID, P. Habas, E. Gornik |
|---|---|
| URL: | https://ieeexplore.ieee.org/document/5435968 |
| Parent Title (English): | Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96) |
| Editor: | G. Baccarani, M. Rudan |
| Document Type: | Conference Publication |
| Language: | English |
| Publication Year: | 1996 |
| Release Date: | 2023/06/09 |
| Page Number: | 4 |
| First Page: | 847 |
| Last Page: | 850 |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
