Amorphous Silicon TFTs: Material Characterization, Device Operation, and Bias Stress Modeling
| Author: | Holly C. Slade, M.S. Shur, S.C. Deane, M. Hack |
|---|---|
| Parent Title (English): | The Electrochemical Society Extended Abstracts |
| Document Type: | Conference Publication |
| Language: | English |
| Publication Year: | 1995 |
| Release Date: | 2020/10/14 |
| Tag: | Thin Film Transistors |
| Volume: | 95 |
| Issue: | 2 |
| First Page: | 861 |
