Final testing: a secure release gate towards module manufacturing
Author: | N Ackermann, V. Gutewort, M. Quinque, M. Kühne, E. Stein v. Kamienski, Achim Schulze, R. Wichtendahl |
---|---|
Parent Title (English): | Photovoltaics International |
Document Type: | Contribution to a Periodical |
Language: | English |
Publication Year: | 2010 |
Tag: | Module manufacturing; Photovoltaik |
Issue: | 8 |
faculties / departments: | Fakultät für Angewandte Natur- und Geisteswissenschaften |
Dewey Decimal Classification: | 6 Technik, Medizin, angewandte Wissenschaften / 60 Technik / 600 Technik, Technologie |