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Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices

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Author:C. Fürböck, D. Pogany, M. Litzenberger, E. Gornik, Norbert SeligerORCiD, H. Gossner, T. Müller-Lynch, M. Stecher, W. Werner
Parent Title (English):Journal of Electrostatics
Document Type:Article (peer reviewed)
Language:English
Publication Year:2000
Tag:ESD; smart power device
Volume:49
First Page:195
Last Page:213
Peer reviewed:Ja
faculties / departments:Fakultät für Ingenieurwissenschaften
Dewey Decimal Classification:6 Technik, Medizin, angewandte Wissenschaften / 60 Technik / 600 Technik, Technologie