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Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices

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Author:C. Fuerboeck, Norbert SeligerORCiD, D. Pogany, M. Litzenberger, E. Gornik, M. Stecher, H. Gosser, W. Werner
DOI:https://doi.org/10.1109/IEDM.1998.746451
Parent Title (English):International Electron Devices Meeting (IEDM ’98) Technical Digest
Document Type:Article (peer reviewed)
Language:English
Publication Year:1998
Page Number:4
First Page:691
Last Page:694
faculties / departments:Fakultät für Ingenieurwissenschaften