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Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices

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Author:D. Pogany, Norbert SeligerORCiD, M. Litzenberger, H. Gossner, M. Stecher, T. Müller-Lynch, W. Werner, E. Gornik
DOI:https://doi.org/10.1016/S0026-2714(99)00162-6
ISSN:0026-2714
Parent Title (German):Microelectronics Reliability
Document Type:Article (peer reviewed)
Language:English
Publication Year:1999
Volume:39
Issue:6
Page Number:6
First Page:1143
Last Page:1148
faculties / departments:Fakultät für Ingenieurwissenschaften