• search hit 2 of 145
Back to Result List

Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET’s

Export metadata

Additional Services

Search Google Scholar
Metadaten
Author:A. Castellazzi, V. Kartal, R. Kraus, Norbert SeligerORCiD, M. Honsberg-Riedl, D. Schmitt-Landsiedel
DOI:https://doi.org/10.1016/S0026-2714(03)00319-6
ISSN:0026-2714
Parent Title (German):Microelectronics Reliability
Document Type:Article (peer reviewed)
Language:English
Publication Year:2003
Volume:43
Issue:9
Page Number:6
First Page:1877
Last Page:1882
faculties / departments:Fakultät für Ingenieurwissenschaften