Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation
Author: | A. Castellazzi, R. Kraus, Norbert SeligerORCiD, D. Schmitt-Landsiedel |
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DOI: | https://doi.org/10.1016/S0026-2714(02)00198-1 |
ISSN: | 0026-2714 |
Parent Title (German): | Microelectronics Reliability |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 2002 |
Volume: | 42 |
Issue: | 9 |
Page Number: | 6 |
First Page: | 1605 |
Last Page: | 1610 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |