Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices
Author: | C. Fuerboeck, Norbert SeligerORCiD, D. Pogany, M. Litzenberger, E. Gornik, M. Stecher, H. Gosser, W. Werner |
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DOI: | https://doi.org/10.1109/IEDM.1998.746451 |
Parent Title (English): | International Electron Devices Meeting (IEDM ’98) Technical Digest |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 1998 |
Page Number: | 4 |
First Page: | 691 |
Last Page: | 694 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |