Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET’s
Author: | A. Castellazzi, V. Kartal, R. Kraus, Norbert SeligerORCiD, M. Honsberg-Riedl, D. Schmitt-Landsiedel |
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DOI: | https://doi.org/10.1016/S0026-2714(03)00319-6 |
ISSN: | 0026-2714 |
Parent Title (German): | Microelectronics Reliability |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 2003 |
Volume: | 43 |
Issue: | 9 |
Page Number: | 6 |
First Page: | 1877 |
Last Page: | 1882 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |