DRAM Failure Analysis and Defect Localization Techniques
Author: | Martin Versen |
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ISBN: | 978-1-62708-247-1 |
Parent Title (English): | Microelectronics Failure Analysis, Desk Reference |
Publisher: | ASM International |
Place of publication: | Ohio |
Editor: | Tejinder Gandhi |
Document Type: | Part of a Book |
Language: | English |
Publication Year: | 2019 |
Tag: | Failure Analysis |
Edition: | Seventh Edition |
First Page: | 499 |
Last Page: | 505 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |