Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices
Author: | D. Pogany, Norbert SeligerORCiD, M. Litzenberger, H. Gossner, M. Stecher, T. Müller-Lynch, W. Werner, E. Gornik |
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DOI: | https://doi.org/10.1016/S0026-2714(99)00162-6 |
ISSN: | 0026-2714 |
Parent Title (German): | Microelectronics Reliability |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 1999 |
Volume: | 39 |
Issue: | 6 |
Page Number: | 6 |
First Page: | 1143 |
Last Page: | 1148 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |