Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing
Author: | Norbert SeligerORCiD, P. Habas, D. Pogany, E. Gornik |
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DOI: | https://doi.org/10.1016/S0038-1101(97)00131-7 |
Parent Title (English): | Solid-State Electronics |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 1997 |
Volume: | 41 |
Issue: | 9 |
Page Number: | 8 |
First Page: | 1285 |
Last Page: | 1292 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |