Reliability aspects of semiconductor devices in high temperature applications
Author: | W. Kanert, H. Dettmer, B. Plikat, Norbert SeligerORCiD |
---|---|
DOI: | https://doi.org/10.1016/S0026-2714(03)00313-5 |
ISSN: | 0026-2714 |
Parent Title (German): | Microelectronics Reliability |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 2003 |
Volume: | 43 |
Issue: | 9 |
Page Number: | 8 |
First Page: | 1839 |
Last Page: | 1846 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |