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Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices

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Author:C. Fürböck, D. Pogany, M. Litzenberger, E. Gornik, Norbert SeligerORCiD, H. Gossner, T. Müller-Lynch, M. Stecher, W. Werner
DOI:https://doi.org/10.1109/EOSESD.1999.819067
Parent Title (English):Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Publisher:IEEE
Document Type:Conference Proceeding
Language:English
Publication Year:1999
Tag:ESD; smart power device
First Page:241
Last Page:250
Peer reviewed:Ja
faculties / departments:Fakultät für Ingenieurwissenschaften
Dewey Decimal Classification:6 Technik, Medizin, angewandte Wissenschaften / 60 Technik / 600 Technik, Technologie