• search hit 92 of 1865
Back to Result List

Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices

Export metadata

Additional Services

Search Google Scholar
Metadaten
Author:C. Fuerboeck, Norbert SeligerORCiD, D. Pogany, M. Litzenberger, E. Gornik, M. Stecher, H. Gosser, W. Werner
DOI:https://doi.org/10.1109/IEDM.1998.746451
Parent Title (English):International Electron Devices Meeting (IEDM ’98) Technical Digest
Document Type:Article (peer reviewed)
Language:English
Publication Year:1998
Page Number:4
First Page:691
Last Page:694
faculties / departments:Fakultät für Ingenieurwissenschaften