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A study of backside laser-probe signals in MOSFETs

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Author:Norbert SeligerORCiD, Predrag Habaš, Erich Gornik
DOI:https://doi.org/10.1016/0167-9317(95)00329-0
Parent Title (English):Microelectronic Engineering
Document Type:Article (peer reviewed)
Language:English
Publication Year:1996
Volume:31
Issue:1-4
Page Number:8
First Page:87
Last Page:94
faculties / departments:Fakultät für Ingenieurwissenschaften