Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique
Author: | Norbert SeligerORCiD, P. Habas, E. Gornik |
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URL: | https://ieeexplore.ieee.org/document/5435968 |
Parent Title (English): | Proceedings of the 26th European Solid State Device Research Conference (ESSDERC' 96) |
Editor: | G. Baccarani, M. Rudan |
Document Type: | Conference Proceeding |
Language: | English |
Publication Year: | 1996 |
Page Number: | 4 |
First Page: | 847 |
Last Page: | 850 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |